Company Blog

Synchronizing Multiple MFLI Lock-in Amplifiers

16.09.2019

Are Your Parametric Two-Qubit Gates Limited by the Driving AWG?

13.09.2019

If you are using the Zurich Instruments HDAWG, the answer is no. Let's see why. Parametrically modulated superconducting qubit gates (parametric gates) are usually accomplished by RF-modulation – typically several hundred MHz – of the flux through a mediating coupler element or qubit. Usually, many dBm of signal power are...

Reloading Data into LabOne Modules

29.08.2019

LabOne ® now supports reloading data into its modules when using the HDF5 file format. Starting from LabOne 19.05, data acquired in modules such as the Sweeper, DAQ, Scope and Spectrum Analyzer, can be reloaded into the same LabOne module. When the data is loaded into the module, it is...

Connecting the MFLI to an External Signal Generator

26.07.2019

This blog post describes how to use the MFLI Lock-in Amplifier with an external reference frequency. The reference frequency comes from a signal generator Model 6221 from Keithley which is used to apply higher voltage pulses or sinusoidal signals on the sample. In some situations the MFLI can be used...

使用MFIA阻抗分析仪测量DC-Link电容器的低串联等效电阻（ESR）和低串联等效电感（ESL）

17.07.2019

Bringing Together the SPM Community in Zurich

03.06.2019

"Jamais 2 sans 3" as the French say, where number 3 worked as a charm. We were able to host the third SPM User Meeting in our home city and brought together more users than ever before to share their experiences with Zurich Instruments! Scanning probe microscopy is a broad...

使用MFIA阻抗分析仪表征超级电容器的串联等效电阻（ESR）

27.05.2019

Frequency-Domain Response of Lock-in Filters

19.03.2019

Introduction The response of a lock-in amplifier is characterized by the parameters of its low-pass filter (LPF), i.e., time constant and filter order. The temporal response of the LPF demonstrates the latency of measurement while its spectral response shows the noise characteristics of measured signals. This blog post explains how...

Gated Data Transfer for Increased Data Sampling Rate

19.12.2018

Introduction For measurements of signals that change rapidly, for example, when measuring capacitance transients in deep level transient spectroscopy (DLTS), high temporal resolution is required. In its standard operating configuration, the MFIA (or the MFLI with the MF-IA option) can sample and transfer impedance data at a continuous rate of...

Square pulses for DLTS Measurements on the MFIA

22.08.2018

Introduction This blog post shows how to produce square voltage pulses and capture the resulting capacitance transients on a short timescale (20 us), for example, for deep level transient spectroscopy (DLTS) measurements. Using the LabOne ® Threshold Unit (which comes as a standard with the MFIA), it's possible to produce...

Rapid and Accurate C-V Measurements on the MFIA

19.08.2018

Fast C-V Measurements up to 3000 V/s This blog post demonstrates the ability of the MFIA (and of the MFLI with the MF-IA option) to measure capacitance on a short timescale (20 us) as a function of DC bias voltage, for example, for fast capacitance-voltage profiling measurements. Voltage sweeps of...

How to Demodulate Multi-frequency Signals such as AM, FM and PM

20.03.2018

Introduction When analyzing signals with multiple frequency components, it is important to measure the amplitude and phase of each frequency component accurately so that a change in the characteristics of one component does not affect the measurement of another frequency component. There are two different approaches to multi-frequency signal demodulation...

Generation of Single-Sideband Modulation by Arbitrary Waveform Generators

15.12.2017

Introduction I/Q modulations are extensively used in a variety of applications including telecommunications, quantum computing (QC), nuclear magnetic resonance (NMR), electron paramagnetic resonance (EPR) spectroscopy and band-excitation atomic force microscopy (AFM). In this post, we demonstrate how to generate such signals using arbitrary waveform generators from Zurich Instruments with an...

Formation sur les Techniques KFM à Grenoble

29.11.2017

Pour la seconde année consécutive, le réseau RéMiSoL, avec le soutien du CEA LETI, de l’IEMN et de partenaires industriels (NanoAndMore, Zurich Instruments), a proposé une action nationale de formation (ANF) CNRS le 7 et 8 novembre sur le thème de la microscopie à sonde de Kelvin (KFM, ou parfois...

Protecting Your Setup From High Voltage Peaks

24.11.2017

This blog post describes how a setup can be protected from overvoltage that occurs when switching off a coil. Fast changing currents induce transient voltages in an inductive load which can be expressed by the formula: V = - L (dI/dt) L is the inductance in Henry and dI/dt is...