Company Blog

Noise Spectral Density Measured with Lock-in Amplifiers

15.08.2021

Input Noise

Proper noise characterization is essential in many applications, especially when dealing with tiny signals buried in noise like in nanotechnology, photonics and quantum physics. Noise characteristics of a system are often represented by the noise spectral density in amplitude or power mode, the latter being called power spectral density (PSD), within the frequency range of interest...

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A LabVIEW Template for Building DLTS Systems with the MFIA

27.07.2021

MFIA configuration

This blog post describes how to get started with writing a LabVIEW™ code to control the MFIA Impedance Analyzer for DLTS measurements . It also includes ideas for independent code for the control of a third-party temperature controller. Deep level transient spectroscopy (DLTS) is a powerful and commonly used technique...

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Loudspeaker Impedance Measurements

26.07.2021

audio fig1

Loudspeakers are electroacoustic transducers that convert electrical signals into acoustic ones. They are commonly found in our daily lives. One of the most frequently used types, known as an electrodynamic loudspeaker, functions by the movement of a cone membrane (diaphragm). When AC electrical signals are sent to the voice coil...

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DLTS User Meeting 2021 – Q&A

19.07.2021

DLTS User Meeting Banner

Deep level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate the concentration and carrier binding energy of semiconductor defects by measuring capacitance transients at different temperatures. As such, it is a critical tool for the characterization of all forms of semiconductors. As an enabler of various...

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How to Characterize Magnetic Materials With Lock-in Amplifiers

15.07.2021

MFLI VSM

In this webinar we covered two basic magnetic characterization techniques, the vibrating sample magnetometry (VSM) and AC susceptibility where lock-in amplifiers are essential part of the measurement and the detection chain. We teamed up with Yury Bugoslavsky, who is managing VSM products at Cryogenic Ltd...

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Low-Frequency DLTS of Perovskite Solar Cells

29.06.2021

Fig.1

Deep level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate the concentration and carrier binding energy of defects in semiconductors. The technique involves measuring capacitance transients at different temperatures, typically at 1 MHz. However, DLTS can also be carried out at lower frequencies such as 80...

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Interdigitated Electrode Sensors for Liquid Measurements

16.06.2021

Fig.1

In previous blog posts, we demonstrated conductivity and permittivity measurements of liquids using the MFIA Impedance Analyzer. To reach the best accuracy, the measurements were carried out using immersion probes or dielectric fixtures with a precisely defined electrode area and spacing. This step is important as any error in the...

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Impedance Measurements with Small Amplitude Test Signals

03.06.2021

Scope showing bit resolution

When taking an impedance measurement, the test signal amplitude can often be a factor that needs to be minimized to avoid unnecessarily disturbing the sample under test. This blog post presents measurements showing how even small test signals of just 500 nV can be used to take a reliable impedance...

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Taking Dielectric Measurements to the Liquid State

25.05.2021

The MFIA Impedance Analyzer is connected to a third-party liquid dielectric test fixture

Liquid dielectrics are dielectric materials in a liquid state and are widely used in electrical insulation as well as cooling. Nonetheless, their fluidity also makes accurate dielectric measurements a challenge. In a previous blog post , we saw how to measure solid-state materials with the MFIA Impedance Analyzer and a...

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Configuring the DAQ Module for Image Acquisition

25.05.2021

Imaging Example

Data synchronization is the key to acquiring images, and in this blog post I explain how to configure the LabOne^® Data Acquisition (DAQ) module for this purpose. Let's start with two concrete scanning microscopy examples...

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Optimizing the SNR of Laser-Scanning Microscopes with Lock-in Amplifiers

25.05.2021

Laser Scanning

Improving the signal-to-noise ratio (SNR) is desirable for every laser-scanning microscopy application. It enables the observation of smaller changes or faster processes in a sample. This blog post explains how using a lock-in amplifier or a boxcar averager can boost the SNR compared to using a digitizer only. Furthermore, I...

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Randomized Benchmarking in Seconds

20.05.2021

Random Benchmarking Sequence

Randomized benchmarking (RB) is a widely used tool in quantum information science to determine qubit fidelity and to characterize individual qubit gates. It is also an excellent example of a quantum experiment with advanced requirements on the control hardware and software. For an RB experiment, we apply random sequences of...

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The Next Generation of Signal Generators - SHFSG Launch Event

05.05.2021

SHFSG Launch Event

On April 29th, Jan Benhelm, Mark Kasperczyk and I welcomed a crowd of customers to the interactive online event introducing Zurich Instruments’ newest product, the SHFSG Signal Generator. Our aim was to present multiple perspectives on the launch of this powerful instrument. Jan provided an overview of Zurich Instruments’ quantum...

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Comparison of Liquid Conductivity Probes

29.04.2021

EIS Probe

In a previous blog post , we described how to use the MFIA Impedance Analyzer to measure the electrochemical impedance spectrum (EIS) of a liquid sample and to derive the conductivity with EIS modeling. The post presented a 5-element equivalent circuit model, which required a relatively deep understanding of electrochemistry...

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Customized Output Data Format for Impedance Sweeps

16.04.2021

Data Format

This short blog post shows you how to customize the exported data of your impedance sweeps on the MFIA and MFLI with MF-IA option. The Sweeper module of LabOne^® is an excellent tool to sweep frequency, amplitude or bias offset, and measure multiple parameters as a function of the swept parameter.

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