Company Blog

AWG Precompensation for High-Fidelity CZ Gates in Transmon Qubits

02.11.2019

High quantum gate fidelity is essential for all quantum hardware platforms. Temporal sensitivity to flux noise and flux pulse distortion can pose major limitations to achieving high fidelity with repeatable two-qubit gates in transmon qubits. In a recent publication, Rol and collaborators demonstrated a fast (40 ns), low-leakage (0.1%), high-fidelity...

Resonance Enhancement - A Tale of Two Data Analysis Methods

17.09.2019

Benefit and Challenge of Resonance Enhancement Resonance enhancement technique is the fastlane toward raising signal well above the noise floor to increase signal-to-noise ratio (SNR) and dynamical range. Such an approach is common for scanning probe microscopy (SPM) or nano-/micro-electromechanical systems (NEMS/MEMS) that rely on mechanical amplification from a vibrating...

Synchronizing Multiple MFLI Lock-in Amplifiers

16.09.2019

Are Your Parametric Two-Qubit Gates Limited by the Driving AWG?

13.09.2019

If you are using the Zurich Instruments HDAWG, the answer is no. Let's see why. Parametrically modulated superconducting qubit gates (parametric gates) are usually accomplished by RF-modulation – typically several hundred MHz – of the flux through a mediating coupler element or qubit. Usually, many dBm of signal power are...

Reloading Data into LabOne Modules

29.08.2019

LabOne ® now supports reloading data into its modules when using the HDF5 file format. Starting from LabOne 19.05, data acquired in modules such as the Sweeper, DAQ, Scope and Spectrum Analyzer, can be reloaded into the same LabOne module. When the data is loaded into the module, it is...

What is the Basic Accuracy of an Impedance Analyzer?

29.08.2019

This blog post explains the meaning of basic accuracy when referring to impedance analyzers. The accuracy of an impedance analyzer is a critical parameter that allows the user to know how close the measured impedance will be to the true impedance of the device or sample under test. As the...

Automated 2D Impedance Sweeps on the MFIA

28.08.2019

Connecting the MFLI to an External Signal Generator

26.07.2019

This blog post describes how to use the MFLI Lock-in Amplifier with an external reference frequency. The reference frequency comes from a signal generator Model 6221 from Keithley which is used to apply higher voltage pulses or sinusoidal signals on the sample. In some situations the MFLI can be used...

Measuring Low ESL and Low ESR of a DC-Link Capacitor

10.06.2019

Bringing Together the SPM Community in Zurich

03.06.2019

"Jamais 2 sans 3" as the French say, where number 3 worked as a charm. We were able to host the third SPM User Meeting in our home city and brought together more users than ever before to share their experiences with Zurich Instruments! Scanning probe microscopy is a broad...

Frequency-Domain Response of Lock-in Filters

19.03.2019

Introduction The response of a lock-in amplifier is characterized by the parameters of its low-pass filter (LPF), i.e., time constant and filter order. The temporal response of the LPF demonstrates the latency of measurement while its spectral response shows the noise characteristics of measured signals. This blog post explains how...

Gated Data Transfer for Increased Data Sampling Rate

19.12.2018

Introduction For measurements of signals that change rapidly, for example, when measuring capacitance transients in deep level transient spectroscopy (DLTS), high temporal resolution is required. In its standard operating configuration, the MFIA (or the MFLI with the MF-IA option) can sample and transfer impedance data at a continuous rate of...

Square pulses for DLTS Measurements on the MFIA

22.08.2018

Introduction This blog post shows how to produce square voltage pulses and capture the resulting capacitance transients on a short timescale (20 us), for example, for deep level transient spectroscopy (DLTS) measurements. Using the LabOne ® Threshold Unit (which comes as a standard with the MFIA), it's possible to produce...

Rapid and Accurate C-V Measurements on the MFIA

19.08.2018

Fast C-V Measurements up to 3000 V/s This blog post demonstrates the ability of the MFIA (and of the MFLI with the MF-IA option) to measure capacitance on a short timescale (20 us) as a function of DC bias voltage, for example, for fast capacitance-voltage profiling measurements. Voltage sweeps of...

How to Demodulate Multi-frequency Signals such as AM, FM and PM

20.03.2018

Introduction When analyzing signals with multiple frequency components, it is important to measure the amplitude and phase of each frequency component accurately so that a change in the characteristics of one component does not affect the measurement of another frequency component. There are two different approaches to multi-frequency signal demodulation...