Scanning Probe Microscopy

High-Speed AFM Measurements

19.02.2014

Typically, for biological and catalysis applications time matters - and AFM images recorded in 10 minutes or longer are not acceptable. We often receive inquiries about what constitutes a complete solution for 'fast AFM' and what Zurich Instruments can offer in this area. Therefore, I would like to describe here...

Q-Control Example VI Tutorial

04.12.2012

Using a Zurich Instruments lock-in amplifier, you can measure the quality factor of an arbitrary resonator - typically a resonant beam used in non-contact atomic force microscopy (NC-AFM) applications. This can be useful to increase phase sensitivity in a phase-locked loop (PLL) setup, for example, or to increase the characteristic...

Resolution, Scanning Speed and Demodulation Bandwidth

06.12.2011

This post is about the interplay between resolution, scanning speed and demodulation bandwidth. I demonstrate how the scanning process can be described in spatial, time and frequency domain, and show that this is a valuable toolbox to analyze your measurement setup as a whole.