APIs

Any measurement resolution is limited by random fluctuations, "noise", of the measured quantities. Practical systems also might experience variations of parameters causing "drifts" in the measurements. Various sources of such noises and drifts may take different time or frequency dependencies. To understand how such fluctuations affect one's measurement, a careful analysis of such noise and drifts must be performed. Discrimination of such noise sources might be performed by performing Allan deviation measurement of discretely sample data. In this blog post, we discuss how to easily measure Allan variance with our Zurich Instruments lock-in amplifier.

An arbitrary waveform generator (AWG) can generate pulses with a timing resolution much finer than its sampling period. Users are often unaware of this capability, yet it enables highly precise timing control in application use cases such as NV center dynamical decoupling, flux pulse width control, AWG channel deskew, and IQ mixer calibration...

When operating qubits, speed and high system utilization are key to achieving rapid progress. In this blog post, you’ll find a collection of five important tips to optimize the throughput of your Zurich Instruments Quantum Computing Control System (QCCS) and perform measurements faster than ever!

In this blog post, we intend to shed light on zhinst-toolkit, our all-new high-level Python API. It aims to provide a pythonic approach to interface the test and measurement instruments from Zurich Instruments.

Spectral characterization of signals and systems is required in a broad range of applications in physics and engineering. Analyzing a signal in the frequency domain reveals valuable information about the signal behavior which is not necessarily obtainable from its time-domain analysis...

This short blog post shows you how to customize the exported data of your impedance sweeps on the MFIA and MFLI with MF-IA option. The Sweeper module of LabOne^® is an excellent tool to sweep frequency, amplitude or bias offset, and measure multiple parameters as a function of the swept parameter.