Webinars

Deep-level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate semiconductor defects' concentration and carrier binding energy by measuring capacitance transients at different temperatures. As such, it is a critical tool for the characterization of all forms of semiconductors. As an enabler of various DLTS modes for highly demanding applications, Zurich Instruments wishes to bring together the community of users facing distinct measurement challenges while sharing core competencies and know-how.

The SPM User Meeting 2023 focused on quantum sensing, imaging, and microwave detection. Our speakers covered the following application areas: nitrogen vacancy (NV) and color centers, Scanning microwave impedance microscopy (SMIM), radio-frequency (RF) STM and RF-reflectometry, Superconducting quantum interference devices (SQUIDs), nano-magnetic resonance imaging (nano-MRI) and spin detection. To discuss your Scanning Probe Microscopy challenge, contact Romain Stomp and read more on this topic on our page overview.

Watch the full recording of the event here.

Deep level transient spectroscopy (DLTS) is a critical tool for the characterization of semiconductors. In this second edition of the DLTS User Meeting, Zurich Instruments brought together members of the DLTS community, to foster knowledge exchange and to network through scientific talks on the study of defects in Sb2(SSe)3, and in metal halide perovskite solar cells. Detailed tutorials also covered the study of transients and data acquisition. To read the answers to the questions during the live event, take a look at this blog post. To discuss your DLTS challenge, get in touch with Dino Klotz or Meng Li.

Quantum technologies progress towards useful applications at a tremendous pace, with different technological platforms and approaches being explored. As key enablers of control and measurement solutions for quantum computing applications, Zurich Instruments and Rohde & Schwarz brought together researchers in quantum technologies working in different areas and facing distinct challenges but share core competencies and important know-how. Read Clemens' blog to learn more about this webinar.

Deep level transient spectroscopy (DLTS) is a critical tool for the characterization of all forms of semiconductors. In this first edition of the DLTS User Meeting, Zurich Instruments brought together members of the DLTS community to foster knowledge exchange and networking through scientific talks discussing semiconductor defect characterization and the effects of radiation on III-V optoelectronic devices. Detailed tutorials also covered the study of transients and data acquisition. To read the answers to the questions asked during the live event, take a look at this blog post. To discuss your DLTS challenge, get in touch with Tim Ashworth, Roberto Foddis or Meng Li.

Scanning probe microscopy (SPM) offers many powerful techniques to image and control microscopic objects. In this fifth edition of the SPM User Meeting, Zurich Instruments brought together SPM enthusiasts to foster knowledge exchange and networking through scientific talks discussing the latest advances on how to image functional materials (such as perovskites, solar cells and ferroelectrics), through detailed tutorials and with a round table on Kelvin probe force microscopy (KPFM). To discuss your SPM challenge, get in touch with Romain Stomp and Mehdi Alem.

This session features a talk by Prof. Brice Gautier (INSA Lyon) and a tutorial by Dr. Romain Stomp (Zurich Instruments).
In this talk, Brice reviews the technical aspects enabling the use of PFM for domain imaging, hysteresis loops and domain engineering in the DFRT mode. He points out the most common artefacts and shows how experimental conditions influence measured properties. Brice also provides examples of ferroelectric domain control by means of an electric field or mechanical stress. Following the talk, Romain's tutorial looks into the DFRT method and feedback optimization.

This session features a talk by Mr. Valentin Aubriet (CEA-LETI Grenoble) and a tutorial by Dr. Mehdi Alem (Zurich Instruments).
In this talk, Valentin presents a setup for heterodyne Kelvin Probe Force Microscopy (h-KPFM) – featuring the HF2LI Lock-in Amplifier – under frequency-modulated and wavelength-dependent illumination. He then shows how to characterize silicon interfaces embedded under different types of oxides. In the tutorial following this talk, Mehdi discusses electrical pump-probe methods with arbitrary waveform generators.