Blogs

Gated Data Transfer for Increased Data Sampling Rate

19.12.2018

Introduction For measurements of signals that change rapidly, for example, when measuring capacitance transients in deep level transient spectroscopy (DLTS), high temporal resolution is required. In its standard operating configuration, the MFIA (or the MFLI with the MF-IA option) can sample and transfer impedance data at a continuous rate of...

Square pulses for DLTS Measurements on the MFIA

22.08.2018

Introduction This blog post shows how to produce square voltage pulses and capture the resulting capacitance transients on a short timescale (20 us), for example, for deep level transient spectroscopy (DLTS) measurements. Using the LabOne ® Threshold Unit (which comes as a standard with the MFIA), it's possible to produce...

Kramers–Kronig Test Applied to Impedance Measurements of Electrical Circuits

25.09.2017

Introduction In this post, the Kramers-Kronig relations are used to verify the results of an impedance measurement experiment performed with the Zurich Instruments MFIA Impedance Analyzer or the MFLI Lock-in Amplifier equipped with the MF-IA option. The Kramers-Kronig relations state that the real part of the impedance can be obtained...

The Nyquist Diagram for Electrical Circuits

11.01.2017

The Nyquist diagram of a transfer function is a parametric plot of its imaginary part versus real part as the frequency sweeps in a certain range. When dealing with electric circuits, the transfer function is the immittance of the circuit, i.e., it can be either the impedance or the admittance of the circuit...

Company Blog

Gated Data Transfer for Increased Data Sampling Rate

Square pulses for DLTS Measurements on the MFIA

Kramers–Kronig Test Applied to Impedance Measurements of Electrical Circuits

The Nyquist Diagram for Electrical Circuits